OLED and QLED Background Capability to Meet Customer Demands

In-house device characterization

  • Sputtering
  • UV lithographic mask aligner
  • VTE and plasma enhanced CVD system
  • Light distribution/integrating sphere

OLED lifetime killer identification

  • Customized chamber to examine the impurities
  • Long-term VTE runs mimicking mass
  • OLED lifetime measurement

Validation of QLEDs and perovskites

  • Size dispersion and film quality control
  • Cd-free QLED evaluation
  • EQE and lifetime reproducibility
  • Cross-sectional TEM, SEM-EDX, etc.

Toward Soft Electronics and XR Applications

Barrier and micro-structuring

  • Low temperature (60℃) CVD
  • Thin-film encapsulation
  • Stepper lithography and dry-etching

Laser lift-off for flexible devices

  • Wearable device fabrication
  • Verification of functional materials
  • Proof-of-Concept for sensor applications


  • 3D wiring and packaging on Si wafer
  • MEMS structuring
  • Proof-of-Concept for micro-OLED or organic-CMOS architectures